The trademark application SF-3 was filed by Otsuka Electronics Co., Ltd., a corporation established under the laws of Japan (the "Applicant"). Application under examination.
The application was filed in English (German was selected as the second language).
Goods And Services
The mark was filed in class 9 with following description of goods:
Interferometry measuring apparatus of wafer thickness
Silicon wafer thickness monitoring systems
Apparatus for measuring wafer thickness
Laser measuring systems
Lasers for measuring
Measuring equipment
Electrical measuring equipment
Electric measuring devices
Electric measuring apparatus
Electric measuring instruments
Measuring apparatus and instruments
Measuring, detecting, monitoring and controlling devices
Measuring, detecting, monitoring and controlling equipment.